Thin Film Deposition and Analysis Instruments
 
PECVD
Sputtering System
Reactive Ion Etching System
ALD Reactor
Nanocluster Deposition System
Rapid Thermal Anneal Owen
Hall Effect System
Probe Station
PL Mapping System
Ellipsometer
Reflectometer
Material Surface Analysis Instruments
 
Kelvin Probe
3D Non-Contact Profiling
Tribometer
Contact Angle Meter
Tensiometer
SPR Spectrometer
Colloid & Aerosol Instruments
 
Aerosol Instrument
Acoustic & Electroacoustic Spectrometer
Spin Coater
Nano Material Analysis
 
Nano Indentation Tester
NSOM
Multi-probe SPM
Other Instruments
 
High Speed Viedo Camera
Photo Reactor
 
 
 
 
 
 
 
     
 
     
 
     
 
 
 
 
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