Thin Film Deposition and Analysis Instruments   → PECVD → Sputtering System → Reactive Ion Etching System → ALD Reactor → Nanocluster Deposition System → Rapid Thermal Anneal Owen → Hall Effect System → Probe Station → PL Mapping System → Ellipsometer → Reflectometer Material Surface Analysis Instruments   → Kelvin Probe → 3D Non-Contact Profiling → Tribometer → Contact Angle Meter → Tensiometer → SPR Spectrometer Colloid & Aerosol Instruments   → Aerosol Instrument → Acoustic & Electroacoustic Spectrometer → Spin Coater Nano Material Analysis   → Nano Indentation Tester → NSOM → Multi-probe SPM Other Instruments   → High Speed Viedo Camera → Photo Reactor     Cross-Tech will attend the tenth world congress on biosensors in sh… [2008.4.17] USTC purchased our spin coater [2008.3.13] Cross-Tech finished WELAS installation for China University of Petr… [2007.11.22] Cross-Tech finished the profiler acceptance in Gore ShenZhen [2007.10.26] Nanjing University purchased our atomic layer deposition system (AL… [2006.12.29] Yuti Corp.’s Hall effect measurement system passed instrument acce… [2006.10.27] Cross-Tech will attend STM’9 in Dalian [2006.7.28]

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