Thin Film Deposition and Analysis Instruments   → PECVD System → Sputtering System → Reactive Ion Etching System → ALD Reactor → Nanocluster Deposition System → Rapid Thermal Processing Furnace → Spin Coater → Wafer ECV Profiler → Hall Effect Measurement System → Probe Station → PL Mapping System → Ellipsometer → Reflectometer Material Surface Analysis Instruments   → Kelvin Probe → SPR Spectrometer → 3D Non-Contact Profiling → Mechanical Tester → Tribometer → Contact Angle Meter Colloid & Aerosol Instruments   → Aerosol Instrument → Acoustic & Electroacoustic Spectrometer Nano Material Analysis   → NSOM → Multi-probe SPM Other Instruments   → High Speed Viedo Camera → Photo Reactor     We delivered ALD reactor to East China Normal University [2009.1.16] Rapid Thermal Processing Furnace(RTP) accepted by SCUT user [2008.12.19] Zhejiang University Purchased SPR System from Cross-Tech [2008.8.30] Cross-Tech will attend the tenth world congress on biosensors in sh… [2008.4.17] USTC purchased spin coater(WS-400B) from Cross-Tech [2008.3.13] Cross-Tech finished Palas WELAS installation in China University of… [2007.11.22] Cross-Tech finished the optical profiler acceptance in Gore ShenZhen [2007.10.26]

© COPYRIGHT BY CROSS-TECH